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See our related work on "Particle Augmented Mixed
Lubrication" (PAML)
The Slurry Subgroup
Here we’ve developed a 2D proof of concept
simulation with sinusoidal
(idealized) pad roughness.
The slurry sub-group studies fluids with
nanoparticles in them from a tribological perspective. We are
interested in the fluid mechanics, the particle dynamics, and the
resulting tribology that occurs when these components exist between
sliding surfaces. The study of slurries have strong applications to
integrated circuit fabrication (CMP), particulate-fluid lubrication of
metal forming processes, suspension dynamics, and many other
solid/liquid flows.
Chemical mechanical polishing (CMP) is a
slurry-based process commonly used to planarize or polish thin film
surfaces to enable stacking of additional levels to enhance
lithographic patterning of wafers. After several nano-processing steps
(e.g., photolithography, deposition, etc.), it is used to make surfaces
atomically smooth and is also an interim step in IC and data storage
disk and media manufacturing.
Particle-Slurry Motion
Higgs III, C.F., Terrell, E., and Garcia,
J., “Particulate Flow
Tribological Issues during the CMP of Nanostructures,”
IMIC Conference Proceedings, 2005
Wear & Contact Evolution of “Exaggerated Rough”
Pad against Aluminum Film
Pad Surface (shown in blue)
H = 7 GPa*
E = 0.3 GPa
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Pad Downforce = 10 µN
Sliding Velocity = 1.25 m/s
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Aluminum Film
H = 2 GPa
Em = 70 GPa
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Stress Distribution

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